For decades, Low Energy Electron Microscopy (LEEM) and Photoelectron Emission Microscopy (PEEM) have been proven techniques for studying properties at the micro- and nano-scale. Characterization of new materials, nanomaterials and nanostructures require combining of different types of measurement data to determine their properties, and structural information is very important to understand growth, electronic structure or reactivity. This information can be obtained by microscopic methods. Additionally, these techniques yield spectroscopic information, and when combined, the resulting spectro-microscopic data provides an integrated and comprehensive insight into materials properties.

The SPECS LEEM/PEEM instrument is a next generation Low Energy Electron Microscope with unsurpassed 5 nm resolution for dynamic LEEM microscopy experiments. With this instrument, based on the design of Dr. Rudolf Tromp, nanometer scale processes on surfaces can be observed in real-time. The instrument is always equipped with an energy filter for spectromicroscopy and is available in a standard version, an aberration corrected version for lateral LEEM resolutions below 2 nm and as a Near Ambient Pressure version for studies in pressures up to 1 mbar.

Giorgi Tchutchulashvili
Application Engineer